AUTOMATIC ANALYSIS DEVICE - HITACHI HIGH TECH CORP

Title:

AUTOMATIC ANALYSIS DEVICE

Document Type and Number:

WIPO Patent Application WO/2012/011481

Kind Code:

A1

Abstract:

Provided is an automatic analysis device which makes it possible to efficiently supply liquid, shorten the analysis cycle, and carry out analysis with a high degree of precision. The automatic analysis device is provided with: a suction nozzle which suctions a sample and a solution used for detection of the sample; a detection container which has the suctioned sample and solution fed thereto; and a detector which detects a signal from the sample. A container for the sample and a container for the solution are disposed at the lower side of the detection container.

Inventors:

SAKASHITA YUKINORI (JP)
TAKAHASHI KATSUAKI (JP)
YAMASHITA YOSHIHIRO (JP)
SAKAZUME TAKU (JP)

Application Number:

PCT/JP2011/066403

Publication Date:

January 26, 2012

Filing Date:

July 20, 2011

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)
SAKASHITA YUKINORI (JP)
TAKAHASHI KATSUAKI (JP)
YAMASHITA YOSHIHIRO (JP)
SAKAZUME TAKU (JP)

International Classes:

G01N35/02; G01N35/00; G01N35/10

Domestic Patent References:

WO2006062236A1

2006-06-15

Foreign References:

JP2008058127A	2008-03-13
JPH04318451A	1992-11-10
JPH0610868U	1994-02-10
JP2000206008A	2000-07-28
JP2008058127A	2008-03-13

Other References: