Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/163745
Kind Code:
A1
Abstract:
In an automatic analysis device, in which measuring units for performing a plurality of different analyses are integrated into a single device, other operable measuring units are required to be operated even when one measuring unit has an abnormality. However, with regard to reagents and consumables managed in common, there was a problem in that the masking situation was not reflected even when masking was performed so as not to use a certain measuring unit, and time was allotted to unnecessary preparation for the unused measuring unit. An automatic analysis device according to the present invention is provided with: a sample disk for holding a sample container that accommodates a sample; a reagent disk for holding a reagent container that accommodates a reagent; at least two different measuring units that respectively perform different types of analyses; and a control part that controls the measuring units. The automatic analysis device is characterized by being provided with a display part that displays: a work flow area in which the flow of operation of the two or more measuring units is displayed; and an overview area in which the usable or unusable states of the respective measuring units are displayed, wherein the overview area has a unit necessity-of-use selection part that can select whether using each of the measuring units is necessary, and the control part controls the display part so as to change the display of the work flow area on the basis of the information set in the unit necessity-of-use selection part.
Inventors:
YABUTANI CHIE (JP)
YAMADA TAKUMI (JP)
IIJIMA MASAHIKO (JP)
YAMADA TAKUMI (JP)
IIJIMA MASAHIKO (JP)
Application Number:
PCT/JP2018/005244
Publication Date:
September 13, 2018
Filing Date:
February 15, 2018
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
| WO2006107016A1 | 2006-10-12 |
Foreign References:
| JP2000227434A | 2000-08-15 | |||
| JP2007040883A | 2007-02-15 | |||
| JP2004028932A | 2004-01-29 | |||
| JP2001013151A | 2001-01-19 | |||
| JP2004028932A | 2004-01-29 |
Other References:
See also references of EP 3594688A4
Attorney, Agent or Firm:
IWASAKI Shigemi (JP)
Download PDF:
Previous Patent: AUTOMATIC ANALYSIS DEVICE
Next Patent: CURABLE COMPOSITION, COATING MATERIAL, ELECTRIC WIRE, AND RESINOUS ARTICLE
Next Patent: CURABLE COMPOSITION, COATING MATERIAL, ELECTRIC WIRE, AND RESINOUS ARTICLE