Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/073644
Kind Code:
A1
Abstract:
An automatic analysis device is provided which, even when the configuration of an inspection system has been changed, can avoid increases in cost without major changes in configuration, and which can reduce the load on the operator. A pin 306 that fits in a hole 305a formed in a sample container conveying unit 102a is formed on a sample container conveying unit attachment surface 304 positioned below a sample suction position 110, and even when sample container conveying units are of different types, this automatic analysis device can make relative positions of constituent components of a sample dispensing unit 105 and a sample container conveying unit 102a identical during sample dispensing operations and make drive conditions identical when moving each axis of the sample dispensing unit 105, and thus can ensure stability of identical sample dispensing operations before and after changing a sample container conveying unit. An operator must learn a maintenance operation procedure for the sample container conveying unit 102a, but there is no change in the maintenance procedures of other units of the automatic analysis device, which reduces the burden on the operator by obviating the need to learn new operation procedures for said other units.
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Inventors:
OKUSA TAKENORI (JP)
SAKAIRI SUSUMU (JP)
SAKAIRI SUSUMU (JP)
Application Number:
PCT/JP2018/025704
Publication Date:
April 18, 2019
Filing Date:
July 06, 2018
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/04
Foreign References:
| JPH03285175A | 1991-12-16 | |||
| JP2000028621A | 2000-01-28 | |||
| JP2008180638A | 2008-08-07 | |||
| JPH10325839A | 1998-12-08 | |||
| US20060083660A1 | 2006-04-20 | |||
| US4046248A | 1977-09-06 | |||
| JPS5439107B2 | 1979-11-26 |
Other References:
See also references of EP 3696552A4
Attorney, Agent or Firm:
KAICHI IP (JP)
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