AUTOMATIC ANALYSIS DEVICE - HITACHI HIGH TECH CORP

Title:

AUTOMATIC ANALYSIS DEVICE

Document Type and Number:

WIPO Patent Application WO/2019/138720

Kind Code:

A1

Abstract:

According to the present invention, an automatic analysis device is achieved which is capable of: setting a dispensing mechanism the dispensing accuracy of which is to be measured, and a dispensing amount; and measuring the dispensing accuracy while omitting an absorbance measurement. A dispensing mechanism, the dispensing accuracy of which is desired to be measured, is designated (S201), and a parameter such as a dispensing amount is input (S202). For each designated dispensing mechanism, a dispensing operation with the input dispensing amount is automatically executed (S203-S216). A reagent or the like with the input dispensing amount, which is dispensed by a designated dispensing mechanism, is contained in a reaction container. The dispensing accuracy of the designated dispensing mechanism can be measured by measuring the weight of the reagent in the reaction container.

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Inventors:

OTA YUICHIRO (JP)
HAGIWARA TAKAAKI (JP)
YAMASHITA YOSHIHIRO (JP)
HAMASAKI KOSHIN (JP)

Application Number:

PCT/JP2018/044028

Publication Date:

July 18, 2019

Filing Date:

November 29, 2018

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N35/10; G01N35/00

Domestic Patent References:

WO2016009764A1

2016-01-21

Foreign References:

JP2013145211A	2013-07-25
JP2013190400A	2013-09-26
JP2014106166A	2014-06-09
JPH0339159U	1991-04-16
JPH0751559A	1995-02-28
JP2012018126A	2012-01-26
JP2007175003A	2007-07-12
JP2007327779A	2007-12-20

Other References: