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Title:
AUTOMATIC COMPENSATION METHOD FOR STATISTICAL DRIFT AND TEMPERATURE DRIFT OF RFID RESONANT FREQUENCY, AND CIRCUITS
Document Type and Number:
WIPO Patent Application WO/2023/155459
Kind Code:
A1
Abstract:
The present invention belongs to the technical field of radio frequency identification. Specifically provided are an automatic compensation method for statistical drift and temperature drift of RFID resonant frequency, and circuits. The present application provides a complete calibration compensation technique for the impact of statistical drift and temperature drift on resonance performance, which a radio frequency identification tag chip product faces; and the automatic compensation for statistical drift enables a step, in which a special device is used for calibration, to be omitted from a finished product production process for a radio frequency identification tag, thus greatly increasing the production efficiency and yield. The present application further comprises an automatic compensation technique for temperature drift of a resonance circuit, in which multiple different implementation solutions are used for products having different fine logical control requirements, thus fundamentally solving the impact of temperature drift on resonant frequency. A frequency calibration process performed after power-on reset, which is disclosed by the present application, definitely provides control steps for statistical drift and temperature drift compensation, and a guiding thought thereof can be developed into a more general circuit compensation technique in the field of low-power-consumption wireless communications.

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Inventors:
WU PATRICK BIAN (CN)
Application Number:
PCT/CN2022/126033
Publication Date:
August 24, 2023
Filing Date:
October 19, 2022
Export Citation:
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Assignee:
EXCELIO TECH SHENZHEN CO LTD (CN)
International Classes:
H03B5/04; H03B5/12
Foreign References:
CN114189212A2022-03-15
CN204497374U2015-07-22
CN1540873A2004-10-27
CN1277752A2000-12-20
CN109086641A2018-12-25
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