Title:
AUTOMATIC EXPOSURE CONTROL METHOD AND SYSTEM FOR X-RAY
Document Type and Number:
WIPO Patent Application WO/2022/134542
Kind Code:
A1
Abstract:
An automatic exposure control method and system for an X-ray. The method comprises: opening a flat panel detector (11), performing parametric configuration on the flat panel detector (11), and selecting an exposure irradiation field; scanning in real time an exposure dose of an exposure irradiation field region, and if it is measured that the exposure dose is greater than a first preset threshold, then determining that exposure has started; once exposure has started, entering into an automatic exposure control mode and triggering the flat panel detector (11) to send out a shutoff control signal; and once exposure has finished, the flat panel detector (11) triggers image collection. Automatic exposure measurement and obtaining an exposure dose when exposure has finished are implemented on the basis of exposure dose measurement of the flat panel detector (11). The present invention is simple in structure, is low-cost, and effectively prevents an exposure dose error due to problems such as circuit delay; also, an image collection cycle is short, and operational complexity is low.
Inventors:
HUANG YIMIN (CN)
HE CHENGLIN (CN)
HE CHENGLIN (CN)
Application Number:
PCT/CN2021/105256
Publication Date:
June 30, 2022
Filing Date:
July 08, 2021
Export Citation:
Assignee:
IRAY TECH CO LTD (CN)
International Classes:
H05G1/30; A61B6/00
Foreign References:
| CN112312636A | 2021-02-02 | |||
| CN112690811A | 2021-04-23 | |||
| CN112738391A | 2021-04-30 | |||
| CN112672068A | 2021-04-16 | |||
| CN103156625A | 2013-06-19 | |||
| JP2019058208A | 2019-04-18 | |||
| CN104220000A | 2014-12-17 | |||
| CN104427937A | 2015-03-18 | |||
| CN103284736A | 2013-09-11 | |||
| US20070297569A1 | 2007-12-27 | |||
| JP2008086358A | 2008-04-17 |
Attorney, Agent or Firm:
SHANGHAI LUNGTIN LAW FIRM (CN)
Download PDF: