Title:
AUTOMATIC INSPECTION SYSTEM AND AUTOMATIC INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/123950
Kind Code:
A1
Abstract:
The automatic inspection system according to one embodiment of the present invention is provided with: an image recognition unit for recognizing an object included in a captured image of a display region of a digital meter, and outputting a recognition result; a classifier for selecting a classification result corresponding to the recognition result on the basis of the recognition result and information on correspondence of recognition results to classification results, and outputting a classification result as a result of reading of the digital meter; and a classifier changing unit for changing the correspondence between the recognition result and the classification result in the correspondence information, or changing the classifier itself.
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Inventors:
ONO KAZUO (JP)
NISHIMURA TAKUMA (JP)
NISHIMURA TAKUMA (JP)
Application Number:
PCT/JP2021/040019
Publication Date:
June 16, 2022
Filing Date:
October 29, 2021
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G08C19/00; G06T7/00; G08C17/00; H04Q9/00
Foreign References:
| JP2016173760A | 2016-09-29 | |||
| JP2000200322A | 2000-07-18 | |||
| US20060045389A1 | 2006-03-02 | |||
| JP2021108022A | 2021-07-29 |
Attorney, Agent or Firm:
SHIN-YU INTERNATIONAL PATENT FIRM (JP)
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