AUTOMATIC MONITORING AND STATISTICAL ANALYSIS OF DYNAMIC PROCESS METRICS TO EXPOSE MEANINGFUL CHANGES

Title:

AUTOMATIC MONITORING AND STATISTICAL ANALYSIS OF DYNAMIC PROCESS METRICS TO EXPOSE MEANINGFUL CHANGES

Document Type and Number:

WIPO Patent Application WO2005060687

Kind Code:

A3

Abstract:

A selection module (402) allows a user to specify at least one measure to be monitored in at least one dimension of a dimensional hierarchy (Figure 4). A control limit calculator (406) extracts, for each specified measure and for each specified dimension, a time series from a multidimensional database for the specified measure in the specified dimension and automatically calculates one or more control limits (412) for the specified measure in the specified dimension based on the extracted time series using a Statistical Process Control (SPC) technique. Thereafter, a monitoring module (416) monitors newly acquired data including each specified measure in each specified dimension for an out-of-limits condition based on one or more automatically-calculated control limits. An alert module (418) triggers an alert in response to an out-of-limits condition being detected.

Inventors:

LOKKEN ROBERT C (US)

Application Number:

PCT/US2004/042692

Publication Date:

March 30, 2006

Filing Date:

December 17, 2004

Export Citation:

Click for automatic bibliography generation Help

Assignee:

PROCLARITY INC (US)
LOKKEN ROBERT C (US)

International Classes:

G06F11/34; G06F17/30; (IPC1-7): G06F1/30

Foreign References:

US6829621B2	2004-12-07
US6768986B2	2004-07-27

Other References: