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Patent Searching and Data


Title:
AUTOMOBILE CIRCUIT FAULT TEST METHOD AND APPARATUS, AND COMPUTER DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/216912
Kind Code:
A1
Abstract:
An automobile circuit fault test method and apparatus, and a computer device, which are applied to a diagnosis tool. The automobile circuit fault test method comprises the following steps: establishing a communication connection with a vehicle to acquire vehicle information of the vehicle (S1); testing the circuit voltage of at least one sensor of the vehicle according to the automobile information so as to obtain test data, wherein the test data is real-time voltage data of the sensor within a certain time period (S2); performing integrated analysis on the test data to generate a first waveform chart, wherein the first waveform chart comprises a current voltage-time curve corresponding to the real-time voltage data (S3); comparing the first waveform chart with a second waveform chart and a third waveform chart in the database to obtain an analysis result (S4); and generating a test report according to the analysis result and displaying the test report on the screen (S5).

Inventors:
XIAO LINGCONG (CN)
LIU YUNFEI (CN)
SHI YUTAO (CN)
Application Number:
PCT/CN2023/091374
Publication Date:
November 16, 2023
Filing Date:
April 27, 2023
Export Citation:
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Assignee:
THINKCAR SOFTWARE TECH DEVELOPMENT CO LTD (CN)
International Classes:
G05B23/02; G01R31/00; G01R31/08; G01R31/11; G01R31/44; G05B23/00
Foreign References:
CN114610004A2022-06-10
CN114563651A2022-05-31
CN112578200A2021-03-30
CN114442600A2022-05-06
CN104914845A2015-09-16
CN111352044A2020-06-30
CN113067723A2021-07-02
CN114115172A2022-03-01
JP2006275831A2006-10-12
US20150371461A12015-12-24
US20170023632A12017-01-26
Attorney, Agent or Firm:
CHOFN INTELLECTUAL PROPERTY (CN)
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