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Patent Searching and Data


Title:
BACKSCATTER IMAGING DEVICE, CONTROL METHOD, AND INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/017155
Kind Code:
A1
Abstract:
The present disclosure relates to a backscatter imaging device, a control method, and an inspection system. The backscatter imaging device comprises: a ray source assembly (10) used to emit rays toward a scanning region; a backscatter detector array (21) comprising multiple backscatter detectors, and used to receive scattered photons (52) generated by means of backscattering by an object (40) within the scanning region; and a first collimator assembly (22) comprising multiple first collimation channels (22b) respectively corresponding to the multiple backscatter detectors, disposed at one side of the backscatter detector array (21) adjacent to the scanning region, and used to confine the scattered photons (52) generated by means of backscattering by the object (40), such that the multiple backscatter detectors separately receive the photons (52) scattered according to depths within the object (40), wherein collimation angles of at least a portion of the multiple first collimation channels (22b) are adjustable.

Inventors:
CHEN ZHIQIANG (CN)
LI YUANJING (CN)
SUN SHANGMIN (CN)
ZONG CHUNGUANG (CN)
HU YU (CN)
TANG HUAPING (CN)
LIU BICHENG (CN)
WANG WEIZHEN (CN)
Application Number:
PCT/CN2021/104165
Publication Date:
January 27, 2022
Filing Date:
July 02, 2021
Export Citation:
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Assignee:
NUCTECH CO LTD (CN)
International Classes:
G01N23/203; A61B6/00; G01T1/00; G01V5/00
Foreign References:
CN202092973U2011-12-28
US6624431B12003-09-23
CN109671513A2019-04-23
CN105078485A2015-11-25
CN102023169A2011-04-20
Attorney, Agent or Firm:
CCPIT PATENT AND TRADEMARK LAW OFFICE (CN)
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