Title:
BASE MATERIAL PROCESSING DEVICE AND MEANDERING PREDICTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/138761
Kind Code:
A1
Abstract:
According to the present invention, first, a detection position function, which indicates meandering of a base material (9), is calculated in each of a first detection device (Pa) and a second detection device (Pb). Then, a processing position function, which indicates the meandering of the base material (9) at a processing position (P2), is calculated on the basis of these detection position functions. Thereby, the meandering of the base material (9) at the processing position (P2) can be accurately predicted without placing a detection unit (30) at the processing position (P2). In addition, when the phase difference between the two detection position functions matches a prescribed condition, the phase of the processing position function is corrected. Thereby, a deviation in phase caused by standardization can be suppressed.
Inventors:
KAMIGIKU TAKASHI (JP)
YOSHIDA MITSUHIRO (JP)
YOSHIDA MITSUHIRO (JP)
Application Number:
PCT/JP2018/045462
Publication Date:
July 18, 2019
Filing Date:
December 11, 2018
Export Citation:
Assignee:
SCREEN HOLDINGS CO LTD (JP)
International Classes:
B65H7/14; B41J2/01; B41J11/42
Foreign References:
| JP2016088654A | 2016-05-23 | |||
| JP2008155628A | 2008-07-10 | |||
| JP2003182896A | 2003-07-03 |
Attorney, Agent or Firm:
NISHIDA Takami (JP)
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