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Patent Searching and Data


Title:
BEIDOU DEFORMATION MONITORING ERROR TESTING APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2020/216163
Kind Code:
A1
Abstract:
A BeiDou deformation monitoring error testing apparatus and method, comprising a control unit (1), and a reference unit (2), a measurement unit (3), a mobile unit (4) and a multipath simulation unit (5), each connected to the control unit (1) by means of wiring, the mobile unit (4) being disposed at one side of the reference unit (2), the measurement unit (3) being mounted on the mobile unit (4), the mobile unit (4) driving the measurement unit (3) to move horizontally and vertically, and the multipath simulation unit (5) being mounted at one side of the measurement unit (3); the reference unit (2) and the measurement unit (3) being used to measure a theoretical position and an actual position of a BeiDou antenna (32), respectively, and send corresponding position information to the control unit (1), the control unit (1) performing comparative analysis and calculating an error between the two; the multipath simulation unit (5) reflecting a satellite signal so as to interfere with a measurement of the measurement unit. The BeiDou deformation monitoring error testing apparatus and method can realize highly accurate automatic control and simulation of deformation, acquire highly accurate sample data, realize deformation monitoring error testing in static and dynamic multipath environments, and evaluate accuracy of positioning technology in different multipath environments.

Inventors:
DU BOWEN (CN)
LI FENG (CN)
ZHAO WEIGANG (CN)
DU YANLIANG (CN)
Application Number:
PCT/CN2020/085539
Publication Date:
October 29, 2020
Filing Date:
April 20, 2020
Export Citation:
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Assignee:
UNIV BEIHANG (CN)
International Classes:
G01B7/16
Foreign References:
CN110068266A2019-07-30
CN206618406U2017-11-07
CN106526636A2017-03-22
JP2005003512A2005-01-06
US20080129587A12008-06-05
Other References:
ZHANG, BO ET AL.: "A research on using SNR values to mitigate carrier phase multipath in GPS surveying)", SCIENCE OF SURVEYING AND MAPPING, vol. 28, no. 3, 30 September 2003 (2003-09-30), pages 1 - 5, XP055746992, ISSN: 1009-2307
Attorney, Agent or Firm:
BEIJING GAOWO LAW FIRM (CN)
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