Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
BIDIRECTIONAL CONTACT MODULE FOR SEMICONDUCTOR TEST AND SEMICONDUCTOR TEST SOCKET USING SAME
Document Type and Number:
WIPO Patent Application WO/2017/111198
Kind Code:
A1
Abstract:
The present invention relates to a bidirectional contact module for a semiconductor test and a semiconductor test socket using the same. The bidirectional contact module for a semiconductor test according to the present invention comprises: an upper support member of an insulating material having elasticity extending in a longitudinal direction; a plurality of upper mesh parts having conductivity which are attached to the upper surface of the upper support member so as to be spaced apart from each other in the longitudinal direction and contact with terminals of a semiconductor element; a lower support member of an insulating material disposed apart from the upper support member in a vertical direction and having elasticity extending in the longitudinal direction; a lower mesh part having conductivity which is attached to the lower surface of the lower support member apart from each other in the longitudinal direction so as to correspond to the plurality of upper meshes; a lateral support bar of an insulating material which is configured such that the upper support member and the lower support member are coupled at both sides in the vertical direction, and both lateral sides extend outwardly from the upper support member and the lower support member; and a plurality of upper and lower connection parts which electrically connect the upper and lower mesh parts to each other in a corresponding manner. Accordingly, it is possible to compensate for the shortcomings of a pogo-pin type and PCR type semiconductor test sockets, thereby realizing a fine pitch and securing a stable electrical contact even if the height is long or short in the vertical direction.

Inventors:
LEE EUN JOU (KR)
Application Number:
PCT/KR2016/000326
Publication Date:
June 29, 2017
Filing Date:
January 13, 2016
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
INNO GLOBAL INC (KR)
International Classes:
G01R1/04; G01R31/26; G01R31/28
Domestic Patent References:
WO2013100560A12013-07-04
WO2012057399A12012-05-03
Foreign References:
KR101190174B12012-10-12
KR20110085788A2011-07-27
US20080157806A12008-07-03
Attorney, Agent or Firm:
NAMCHON INTERNATIONAL PATENT AND LAW FIRM (KR)
Download PDF: