Title:
BOARD FOR MEASURING PARALLELISM BETWEEN SURFACES OF UPPER AND LOWER SURFACE PLATES, SYSTEM FOR MEASURING PARALLELISM BETWEEN SURFACES OF UPPER AND LOWER SURFACE PLATES, AND METHOD FOR ADJUSTING DISTANCE BETWEEN SURFACES OF UPPER AND LOWER SURFACE PLATES
Document Type and Number:
WIPO Patent Application WO/2007/046552
Kind Code:
A1
Abstract:
A board (3) for accurately and easily measuring a parallelism between the surfaces
of upper and lower surface plates. A plurality of mounting parts for measuring
units (32) are formed on a board body (31). Each of the measuring units (32) comprises
a displacement mechanism part having an upward biased displacement element
displacing according to the distance between the surface of an upper surface
plate (21) and the surface of a lower surface plate (22), a distance-between-upper-and-lower-surface-plates
measuring part for digitally measuring a displacement value A of the displacement
element equivalent to a minimum distance between the surfaces of the upper surface
plate (21) and the lower surface plate (22), and a measured result output part
outputting the measured results by the distance-between-upper-and-lower-surface-plates
measuring part (122).
Inventors:
KUROKAWA, Takashi (())
黒川 隆志 (())
TAKAHASHI, Mitsuhiro (())
黒川 隆志 (())
TAKAHASHI, Mitsuhiro (())
Application Number:
JP2006/321448
Publication Date:
April 26, 2007
Filing Date:
October 20, 2006
Export Citation:
Assignee:
TAKAHASHI KEISEI CORPORATION (1-35, Zao-Matsugaoka 1-chome Yamagata-sh, Yamagata 38, 9902338, JP)
株式会社高橋型精 (〒38 山形県山形市蔵王松ヶ岡一丁目１番３５号 Yamagata, 9902338, JP)
KUROKAWA, Takashi (())
黒川 隆志 (())
株式会社高橋型精 (〒38 山形県山形市蔵王松ヶ岡一丁目１番３５号 Yamagata, 9902338, JP)
KUROKAWA, Takashi (())
黒川 隆志 (())
International Classes:
G01B5/24; B26F1/40; B30B15/00; G01B5/24; B26F1/38; B30B15/00
Attorney, Agent or Firm:
HIRAISHI, Toshiko et al. (1-18-15, Nishi-Shinbashi Minato-ku, Tokyo 03, 1050003, JP)