Title:
CALCULATION DEVICE AND METHOD FOR EXTRACTING FEATURE OF MEASUREMENT DATA BY USING SAME
Document Type and Number:
WIPO Patent Application WO/2022/240269
Kind Code:
A1
Abstract:
According to the present disclosure, a method for extracting a feature of measurement data by using a calculation device may comprise the steps of: identifying measurement data obtained during a process; identifying target data related to the measurement data; performing a calculation on the measurement data on the basis of the target data; extracting a plurality of first values by applying a max pooling layer to the calculated measurement data; extracting a plurality of second values by applying a min pooling layer to the calculated measurement data; and extracting a plurality of third values related to a feature of the measurement data by using the plurality of first values and the plurality of second values.
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Inventors:
KIM SANG YEOP (KR)
PARK JIN WOO (KR)
PARK JIN WOO (KR)
Application Number:
PCT/KR2022/095040
Publication Date:
November 17, 2022
Filing Date:
February 24, 2022
Export Citation:
Assignee:
RTM (KR)
International Classes:
G05B23/02; G05B19/418
Foreign References:
| KR20140015872A | 2014-02-07 | |||
| KR20200037869A | 2020-04-09 | |||
| KR20210020976A | 2021-02-24 | |||
| US20200342287A1 | 2020-10-29 | |||
| KR20200057650A | 2020-05-26 | |||
| KR102326006B1 | 2021-11-15 |
Attorney, Agent or Firm:
LEE & KO IP (KR)
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