Title:
CALCULATION SYSTEM, CALCULATION METHOD, PROGRAM, AND TARGET
Document Type and Number:
WIPO Patent Application WO/2018/229917
Kind Code:
A1
Abstract:
In the present invention: a target equipped with a reference object of a known size is prepared; the reference object is detected via image processing of target image data generated by capturing an image of the target using a surveying device; first size data relating to the size of the reference object is calculated; a defect is detected via image processing of exterior image data generated by capturing an image of the exterior of a structure using the surveying device; defect data relating to the size of the defect is calculated; the first size data is compared to second size data relating to the actual size of the reference object; and correction data for correcting the defect data is calculated.
Inventors:
OHSHIMA YUICHI (JP)
Application Number:
PCT/JP2017/022024
Publication Date:
December 20, 2018
Filing Date:
June 14, 2017
Export Citation:
Assignee:
NIKON TRIMBLE CO LTD (JP)
International Classes:
G01C15/00
Foreign References:
JP2003065959A | 2003-03-05 | |||
JP2000018921A | 2000-01-21 | |||
JP2004163292A | 2004-06-10 | |||
JP2015172498A | 2015-10-01 | |||
JP2016050887A | 2016-04-11 | |||
JP2017049152A | 2017-03-09 | |||
JP2009053126A | 2009-03-12 |
Other References:
See also references of EP 3640588A4
Attorney, Agent or Firm:
ONDA, Makoto et al. (JP)
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