CALIBRATION APPARATUS, METHODS, AND APPLICATIONS

Title:

CALIBRATION APPARATUS, METHODS, AND APPLICATIONS

Document Type and Number:

WIPO Patent Application WO/2012/151360

Kind Code:

A3

Abstract:

An inertial sensor calibration method and inertial sensor calibration apparatus. One or more diffraction patterns are generated by one or more fixed and/or moveable gratings (inertial sensors) illuminated by an atomically stabilized source attached to a base and detected by an imager. The grating and/or inertial sensor has a designed parameter value and an actual respective parameter value, such as motion or distance that can be determined upon ultra-precise measurement. Such ultra-precise measurement can be used to calibrate the grating or inertial sensor.

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Inventors:

LAL AMIT (US)
PIRATLA SARVANI (US)

Application Number:

PCT/US2012/036251

Publication Date:

January 10, 2013

Filing Date:

May 03, 2012

Export Citation:

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Assignee:

UNIV CORNELL (US)
LAL AMIT (US)
PIRATLA SARVANI (US)

International Classes:

G01P15/18; G01P15/02

Foreign References:

US20090228235A1	2009-09-10
JP2002162411A	2002-06-07

Other References:

HALL, N.A. ET AL.: "Micromachined Accelerations with Optical Interferometric R ead-out and Integrated Electostatic Actuation.", JOURNAL OF MICROELECTROMECHANICAL SYSTEMS., vol. 17, no. 1, February 2008 (2008-02-01), pages 37 - 44

Attorney, Agent or Firm:

GREENER, William (Suite 102Ithaca, NY, US)

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