Title:
CALIBRATION DEVICE, CALIBRATION METHOD, TESTER, AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2007/123054
Kind Code:
A1
Abstract:
There is provided a calibration device that calibrates a jitter measuring circuit for outputting a jitter measurement signal depending on the amount of jitter included in an input signal and comprises a signal input and a gain calculator. The signal input inputs in sequence a first input signal having a first cycle and a second input having a second cycle to the jitter measuring circuit. The gain calculator calculates the gain in the jitter measuring circuit according to the jitter measurement signals that the jitter measuring circuit outputs for each of the first and second input signals.
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Inventors:
ISHIDA MASAHIRO (JP)
Application Number:
PCT/JP2007/058116
Publication Date:
November 01, 2007
Filing Date:
April 12, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
ISHIDA MASAHIRO (JP)
ISHIDA MASAHIRO (JP)
International Classes:
G01R29/02; G01R31/28
Domestic Patent References:
| WO2004031784A1 | 2004-04-15 |
Foreign References:
| JPH07321852A | 1995-12-08 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chome,Shinjuku-ku, Tokyo 05, JP)
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