Title:
CALIBRATION METHOD FOR NONLINEAR ANALOG-TO-DIGITAL CONVERSION CIRCUIT, AND REFERENCE VOLTAGE GENERATING CIRCUIT THEREOF
Document Type and Number:
WIPO Patent Application WO/2024/066686
Kind Code:
A1
Abstract:
The present invention provides a calibration method for a nonlinear analog-to-digital conversion circuit of an image sensor, and a reference voltage generating circuit thereof. Before normal operation or during the operating process of a nonlinear analog-to-digital conversion circuit of an image sensor, the nonlinear analog-to-digital conversion circuit of the image sensor is used to test a plurality of reference voltages generated by the reference voltage generating circuit, so as to obtain calibration parameters of the nonlinear analog-to-digital conversion circuit of the image sensor, which are used for calibrating output values of the nonlinear analog-to-digital conversion circuit of the image sensor during normal operation. Therefore, changes in the calibration parameters of the nonlinear analog-to-digital conversion circuit of the image sensor caused when the working environment and the working parameters change are updated in real time, thus improving the stability and precision of the nonlinear analog-to-digital conversion circuit of the image sensor.
Inventors:
ZHAO LIXIN (CN)
LI MINLAN (CN)
QIAO JINGXUAN (CN)
LI MINLAN (CN)
QIAO JINGXUAN (CN)
Application Number:
PCT/CN2023/108170
Publication Date:
April 04, 2024
Filing Date:
July 19, 2023
Export Citation:
Assignee:
GALAXYCORE SHANGHAI LTD CORP (CN)
International Classes:
H03M1/10; G05F1/56
Attorney, Agent or Firm:
UNITALEN ATTORNEYS AT LAW CO., LTD. (CN)
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