Title:
CALIBRATION PATTERNS, CALIBRATION METHOD, AND CALIBRATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2014/162344
Kind Code:
A1
Abstract:
Provided are calibration patterns, a calibration method, and a calibration program, with which calibration of an image processing device and a depth camera using infrared radiation can be easily performed. These calibration patterns (100, 100a-100d) are used in cases when an image processing device (200) and an infrared camera (300) are to be calibrated. In the calibration patterns (100, 100a-100d), recessed portions (130d) and/or protruded portions (110, 110a-110d, 130a, 140a, 115b, 116b, 117c) are formed in surfaces of plate-like members (120, 120a-120c, 170d) provided with said surfaces.
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Inventors:
LUNDBERG JOHANNES (JP)
SUMITOMO TAKAO (JP)
SUMITOMO TAKAO (JP)
Application Number:
PCT/JP2013/002258
Publication Date:
October 09, 2014
Filing Date:
April 01, 2013
Export Citation:
Assignee:
BRILLIANTSERVICE CO LTD (JP)
International Classes:
H04N5/225; H04N5/232
Foreign References:
| JP2006517659A | 2006-07-27 | |||
| JPH0886613A | 1996-04-02 | |||
| JP2005003463A | 2005-01-06 |
Attorney, Agent or Firm:
CREIA IP ATTORNEYS (JP)
Patent business corporation クレイア patent firm (JP)
Patent business corporation クレイア patent firm (JP)
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