Title:
CALIBRATION RULER, CALIBRATION METHOD AND APPARATUS, AND DETECTION METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2024/036952
Kind Code:
A1
Abstract:
A calibration ruler, comprising a ruler body; and at least two calibration pattern subsets (101, 102), which are arranged on the ruler body in a first direction, wherein the at least two calibration pattern subsets (101, 102) comprise a plurality of first calibration blocks (10), which are arranged at intervals in the first direction and are arranged in a staggered manner in a second direction, projections of the plurality of first calibration blocks (10) in the calibration pattern subsets in the first direction have first overlapping areas, and projections of at least two first overlapping areas in the first direction have a second overlapping area. Further provided are a calibration method and apparatus, an image stitching method and apparatus, a detection method and apparatus, and a computer-readable storage medium.
Inventors:
CHEN GUAN (CN)
CHEN FEI (CN)
JIANG GUANNAN (CN)
CHEN FEI (CN)
JIANG GUANNAN (CN)
Application Number:
PCT/CN2023/082890
Publication Date:
February 22, 2024
Filing Date:
March 21, 2023
Export Citation:
Assignee:
CONTEMPORARY AMPEREX TECHNOLOGY CO LTD (CN)
International Classes:
G01B11/00; G06T7/00
Domestic Patent References:
| WO2021254110A1 | 2021-12-23 |
Foreign References:
| CN103175851A | 2013-06-26 | |||
| CN216898747U | 2022-07-05 | |||
| CN113393463A | 2021-09-14 | |||
| CN113379845A | 2021-09-10 | |||
| US10812778B1 | 2020-10-20 |
Attorney, Agent or Firm:
BEIJING HAN KUN LAW OFFICES (CN)
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