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Patent Searching and Data


Title:
CALIBRATION SYSTEM AND MEASURING METHOD BY SAME
Document Type and Number:
WIPO Patent Application WO/2022/222521
Kind Code:
A1
Abstract:
A calibration system and a measuring method by the calibration system. The calibration system comprises a computing unit (1), an optical transmitting and receiving device (3), a reflecting mirror (2), a rotating table (4), and a guide rail (5), wherein the reflecting mirror (2) is mounted at the center of the rotating table (4), the guide rail (5) is connected to a guide rail sliding block (6), the optical transmitting and receiving device (3) is mounted on the guide rail sliding block (6), the optical transmitting and receiving device (3) is suspended directly above the reflecting mirror (2), and the optical transmitting and receiving device (3) is connected to the computing unit (1). The calibration system can accurately acquire data of an included angle between a movement axis (Z) of the guide rail and an axis (θ) of rotation of the rotating table .

Inventors:
ZHANG PENG (CN)
XIAO TIAN (CN)
Application Number:
PCT/CN2021/139707
Publication Date:
October 27, 2022
Filing Date:
December 20, 2021
Export Citation:
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Assignee:
CHOTEST TECH INC (CN)
International Classes:
G01B21/00; G01B11/26
Foreign References:
CN113188494A2021-07-30
CN207763655U2018-08-24
CN203241031U2013-10-16
CN105698713A2016-06-22
CN112596258A2021-04-02
SU1755043A11992-08-15
Attorney, Agent or Firm:
SHENZHEN KINDWALF INTELLECTUAL PROPERTY FIRM (GENERAL PARTERNSHIP) (CN)
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