CALIBRATION SYSTEM, CALIBRATION METHOD, AND CALIBRATION PROGRAM

WIPO Patent Application WO/2017/183567

A1

Provided is a calibration system capable of calibrating an optical measuring device in accordance with the type of the optical measuring device. A calibration system (500) is provided with: a plurality of reference objects; a receiving unit (150) for receiving the type of an optical measuring device to be calibrated, from said optical measuring device; a selecting unit (152) for selecting, from among the plurality of reference objects, a reference object associated with the type of optical measuring device to be calibrated, on the basis of calibration information (84A) which associates the reference objects to be used in a calibration process with each type of optical measuring device; an acquiring unit (156) for outputting to the optical measuring device to be calibrated an instruction to measure the reference object selected by the selecting unit (152), and acquiring measured data relating to the reference object from the optical measuring device to be calibrated; and a calibrating unit (352) for calibrating the optical measuring device to be calibrated, using the measured data.

YAMAMOTO KOJI (JP)
SAKIMOTO MASAHIKO (JP)
SAGISAKA NAOKI (JP)
OKAYAMA AKIHIRO (JP)
YOKOTA SATOSHI (JP)
KUBOTA NORIMASA (JP)

PCT/JP2017/015234

October 26, 2017

April 14, 2017

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KONICA MINOLTA INC (JP)

G01J3/02; G01J3/06; G01J3/50

JP2006153498A	2006-06-15
JP2013221766A	2013-10-28
JP2009008561A	2009-01-15
JPH0634440A	1994-02-08
JPH10300580A	1998-11-13
JPH04301531A	1992-10-26
JP2006047127A	2006-02-16
US8736841B1	2014-05-27
US5319437A	1994-06-07

FUKAMI PATENT OFFICE, P.C. (JP)

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