Title:
CAMERA MODULE INSPECTION DEVICE IMPLEMENTING SUBJECT PATTERN FOR FOCUS TEST IN IMAGE DISPLAY DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/204431
Kind Code:
A1
Abstract:
The technical purpose of the present invention is to provide a camera module inspection device implementing a subject pattern for a focus test in an image display device, the camera module inspection device being capable of implementing an optimized subject pattern suitable for a camera module resolution becoming higher. To this end, the camera module inspection device implementing a subject pattern for a focus test in an image display device, according to the present invention, inspects a camera module in which an image sensor is embedded and comprises: a support; a socket provided in the support and having the camera module loaded therein; and one or more image display devices provided to be spaced from the socket, and displaying, in an image, the subject pattern to be sensed by the image sensor.
Inventors:
LEE JONG-DAE (KR)
CHOI YOON-CHANG (KR)
CHOI YOON-CHANG (KR)
Application Number:
PCT/KR2016/005801
Publication Date:
December 22, 2016
Filing Date:
June 01, 2016
Export Citation:
Assignee:
ISMEDIA CO LTD (KR)
International Classes:
H04N17/00; G01M11/00
Foreign References:
| KR101455846B1 | 2014-11-03 | |||
| KR100622965B1 | 2006-09-14 | |||
| JP2009077114A | 2009-04-09 | |||
| KR100664614B1 | 2007-01-04 | |||
| KR20060082886A | 2006-07-19 |
Attorney, Agent or Firm:
MI PATENT & LAW FIRM (KR)
특허법인 명인 (KR)
특허법인 명인 (KR)
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