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Title:
CAMERA MODULE TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/101674
Kind Code:
A1
Abstract:
Disclosed is a test device which electrically connects a terminal of an object to be tested and a testing terminal of a testing circuit. The test device includes a signal probe; a ground probe; a conductive block configured to comprise a signal probe hole through which the signal probe pass without electric contact, and a ground probe hole through which the ground probe pass with electric contact; and an insulating housing configured to accommodate the conductive block and support opposite ends of the signal probe. Thus, it is possible to effectively shield noise between the signal probe and a signal terminal.

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Inventors:
KIM HEE-CHUL (KR)
Application Number:
PCT/KR2017/013411
Publication Date:
June 07, 2018
Filing Date:
November 23, 2017
Export Citation:
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Assignee:
LEENO IND INC (KR)
International Classes:
H04N17/00; G01R1/04; G01R1/073; G01R31/28; H04N5/225
Foreign References:
KR101534778B12015-07-09
KR20130123193A2013-11-12
JP2011086453A2011-04-28
KR20100095142A2010-08-30
KR20130050235A2013-05-15
Attorney, Agent or Firm:
HUH, Sung-won et al. (KR)
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