Title:
CAPACITANCE MEASUREMENT CIRCUIT, TOUCH-CONTROL CHIP AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/128209
Kind Code:
A1
Abstract:
Provided is a capacitance measurement circuit, which can reduce the influence of screen noise on capacitance measurement. The capacitance measurement circuit is used for measuring the capacitance of a capacitor to be tested, and said capacitor is a capacitor, which is used for performing touch detection, in the screen of an electronic device. The capacitance measurement circuit comprises: an amplification circuit connected to said capacitor and used for converting a capacitance signal of said capacitor into a voltage signal, wherein the voltage signal is associated with the capacitance of said capacitor; and a control circuit connected to the amplification circuit and used for controlling, in a first period, an amplification factor of the amplification circuit to be a first amplification factor, and controlling, in a second period, the amplification factor of the amplification circuit to be a second amplification factor, wherein noise generated by the screen in the first period is less than the noise generated by the screen in the second period, and the first amplification factor is greater than the second amplification factor.
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Inventors:
YUAN GUANGKAI (CN)
LI GUOPAO (CN)
YAO ZHI (CN)
LIAO GUANLIANG (CN)
LI GUOPAO (CN)
YAO ZHI (CN)
LIAO GUANLIANG (CN)
Application Number:
PCT/CN2019/128859
Publication Date:
July 01, 2021
Filing Date:
December 26, 2019
Export Citation:
Assignee:
SHENZHEN GOODIX TECH CO LTD (CN)
International Classes:
G06F3/044
Foreign References:
| CN104007884A | 2014-08-27 | |||
| CN107466368A | 2017-12-12 | |||
| CN102789344A | 2012-11-21 |
Other References:
See also references of EP 3862857A4
Attorney, Agent or Firm:
LONGSUN LEAD IP LTD. (CN)
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