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Title:
CARBON NANOTUBE FILM, TERAHERTZ WAVE DETECTION DEVICE, AND PN JUNCTION FORMING METHOD FOR CARBON NANOTUBE FILM
Document Type and Number:
WIPO Patent Application WO/2018/207780
Kind Code:
A1
Abstract:
Provided are: a carbon nanotube film capable of controlling the Fermi levels of carbon nanotubes; a terahertz wave detection device; and a PN junction forming method for carbon nanotube films. The carbon nanotube film (10) comprises, inside the membrane: a P-type semiconductor region (11); an N-type semiconductor region (12); and a PN junction (13) at which the P-type semiconductor region (11) and the N-type semiconductor region (12) come in contact. The site at which the N-type semiconductor region (12) is formed comprises a complex of: carbon nanotubes; and a crown ether (30) containing an ion liquid (20) and/or cations. The terahertz wave detection device (100) comprises a first electrode (2) and a second electrode (3) arranged facing each other and sandwiching the PN junction (13) therebetween, upon a two-dimensional plane of the carbon nanotube film (10).

Inventors:
KAWANO YUKIO (JP)
SUZUKI DAICHI (JP)
OCHIAI YUKI (JP)
NAGAMUNE TSUTOMU (JP)
Application Number:
PCT/JP2018/017797
Publication Date:
November 15, 2018
Filing Date:
May 08, 2018
Export Citation:
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Assignee:
TOKYO INST TECH (JP)
ZEON CORP (JP)
International Classes:
C01B32/158; C01B32/159; G01J1/02; G01N21/3581
Foreign References:
JP2016157942A2016-09-01
JP2017143209A2017-08-17
Other References:
HE, X. ET AL.: "Carbon Nanotube Terahertz Detector", NANO LETT ., vol. 14, 2014, pages 3953 - 3958, XP055564649
AKAMA, T. ET AL.: "Photovoltaic features of densely-aligned pn junction semiconducting single- walled carbon nanotube films", LECTURE ABSTRACTS OF THE 47TH FULLERENES-NANOTUBES-GRAPHENE GENERAL SYMPOSIUM
KANEKO, T. ET AL.: "Biomolecule Encapsulated Carbon Nanotubes Using Nano Processing in Electrolyte Plasmas", TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, vol. 33, no. 3, 2008, pages 673 - 677
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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