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Title:
CELL OBSERVATION DEVICE AND CELL OBSERVATION METHOD
Document Type and Number:
WIPO Patent Application WO/2011/132587
Kind Code:
A1
Abstract:
The disclosed cell observation device is provided with a reflection interference measurement light source (106), a quantitative phase measurement light source (105), a reflection interference detection camera (110) which, irradiated from the reflection interference measurement light source (106), generates reflection interference images by forming images from light reflected from a cell (101), a quantitative phase detection camera (110) which, irradiated from the quantitative phase measurement light source (105), generates quantitative phase images by forming images from light transmitted through the cell (101), an image alignment unit (201) which aligns the reflection interference images and the quantitative phase images by matching the spatial positions between said two images, a first extraction unit (204) which extracts a first parameter from the reflection interference images aligned with the quantitative phase images, and a second extraction unit (205) which extracts a second parameter from the quantitative phase images aligned with the reflection interference images.

Inventors:
SUGIYAMA Norikazu (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
杉山 範和 (〒58 静岡県浜松市東区市野町1126番地の1 浜松ホトニクス株式会社内 Shizuoka, 〒4358558, JP)
KATAOKA Takuji (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
Application Number:
JP2011/059208
Publication Date:
October 27, 2011
Filing Date:
April 13, 2011
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS K.K. (1126-1, Ichino-cho Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
浜松ホトニクス株式会社 (〒58 静岡県浜松市東区市野町1126番地の1 Shizuoka, 〒4358558, JP)
SUGIYAMA Norikazu (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
杉山 範和 (〒58 静岡県浜松市東区市野町1126番地の1 浜松ホトニクス株式会社内 Shizuoka, 〒4358558, JP)
International Classes:
C12M1/34; C12Q1/02; G01B21/20; G01N21/41
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA 9th fl. 1-1, Marunouchi 2-chome, Chiyoda-k, Tokyo 05, 〒1000005, JP)
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Claims: