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Patent Searching and Data


Title:
CELL TISSUE INSPECTION SYSTEM, CELL CULTURING DEVICE, AND CELL TISSUE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2014/002271
Kind Code:
A1
Abstract:
Provided are a cell culturing device and a system for prompting, on the basis of measurement results from a measurement means in which non-invasive measurement means have been combined, measurement by subsequent measurement means to execute quality inspections non-invasively. That is, impedance is monitored over time during culturing, the impedance measurement results are compared with a specified first threshold value, and depending on whether the measurement result is at or above the first threshold value or is less than the threshold value, subsequent inspection details are modified according to the presence or absence of changes in impedance.

Inventors:
NAKAJIMA RYOTA (JP)
MATSUOKA SHIZU (JP)
ZHOU GUANGBIN (JP)
Application Number:
PCT/JP2012/066779
Publication Date:
January 03, 2014
Filing Date:
June 29, 2012
Export Citation:
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Assignee:
HITACHI LTD (JP)
NAKAJIMA RYOTA (JP)
MATSUOKA SHIZU (JP)
ZHOU GUANGBIN (JP)
International Classes:
C12M1/34; C12M1/00; C12N1/00; G01N27/02; G01N27/416
Foreign References:
JP2011142837A2011-07-28
JP2011089894A2011-05-06
JP2012037435A2012-02-23
JP2007110932A2007-05-10
Other References:
FUNAKOSHI NEWS, 2011, 15 May 2011 (2011-05-15), pages 23
Attorney, Agent or Firm:
POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)
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