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Title:
CHARGED PARTICLE BEAM IRRADIATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/067820
Kind Code:
A1
Abstract:
Provided is a charged particle beam irradiation device capable of suppressing size increases and capable of securing a sufficient irradiation field. The charged particle beam irradiation device according to the present embodiment comprises a first scanning electromagnet part which deflects a charged particle beam that is incident from a first direction to a second direction substantially orthogonal to the first direction, and a second scanning electromagnet part which deflects the charged particle beam to a third direction substantially orthogonal to the first direction and the second direction. The first and second scanning electromagnet parts are arranged parallel to the first direction.

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Inventors:
FURUKAWA TAKUJI (JP)
TAKAYAMA SHIGEKI (JP)
YAZAWA TAKASHI (JP)
KANAI YOSHIHARU (JP)
SATO KOSUKE (JP)
ORIKASA TOMOFUMI (JP)
KOYANAGI KEI (JP)
Application Number:
PCT/JP2015/077711
Publication Date:
May 06, 2016
Filing Date:
September 30, 2015
Export Citation:
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Assignee:
NAT INST RADIOLOG (JP)
TOSHIBA KK (JP)
International Classes:
A61N5/10
Domestic Patent References:
WO2015045017A12015-04-02
Foreign References:
JP2007260222A2007-10-11
JPH05264797A1993-10-12
US20090101832A12009-04-23
JP2013096949A2013-05-20
JP2011072717A2011-04-14
US20130043403A12013-02-21
Attorney, Agent or Firm:
KATSUNUMA Hirohito et al. (JP)
Katsunuma Hirohito (JP)
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