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Patent Searching and Data


Title:
CHARGED PARTICLE RADIATION MEASURING METHOD AND CHARGED PARTICLE RADIATION MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/038622
Kind Code:
A1
Abstract:
[Problem] To provide a radiation measuring instrument having good heat resistance and radiation resistance. [Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device employing a scintillator containing a phosphor having SiAlON phosphor as the main component.

Inventors:
KADA WATARU (JP)
MIURA KENTA (JP)
HANAIZUMI OSAMU (JP)
KAMIYA TOMIHIRO (JP)
SATOH TAKAHIRO (JP)
SUSAKI JUNICHI (JP)
YAMADA SUZUYA (JP)
Application Number:
PCT/JP2016/074813
Publication Date:
March 09, 2017
Filing Date:
August 25, 2016
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Assignee:
NAT UNIV CORP GUNMA UNIV (JP)
JAPAN ATOMIC ENERGY AGENCY (JP)
DENKA COMPANY LTD (JP)
International Classes:
G01T1/20; C09K11/00; C09K11/64; G01T1/202
Domestic Patent References:
WO2014030637A12014-02-27
WO2015133612A12015-09-11
Foreign References:
JP2007302757A2007-11-22
JP2015111322A2015-06-18
Other References:
See also references of EP 3343248A4
Attorney, Agent or Firm:
SONODA & KOBAYASHI INTELLECTUAL PROPERTY LAW (JP)
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