Title:
CHARGED PARTICLE RADIATION MEASURING METHOD AND CHARGED PARTICLE RADIATION MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/038622
Kind Code:
A1
Abstract:
[Problem] To provide a radiation measuring instrument having good heat resistance and radiation resistance.
[Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device employing a scintillator containing a phosphor having SiAlON phosphor as the main component.
Inventors:
KADA WATARU (JP)
MIURA KENTA (JP)
HANAIZUMI OSAMU (JP)
KAMIYA TOMIHIRO (JP)
SATOH TAKAHIRO (JP)
SUSAKI JUNICHI (JP)
YAMADA SUZUYA (JP)
MIURA KENTA (JP)
HANAIZUMI OSAMU (JP)
KAMIYA TOMIHIRO (JP)
SATOH TAKAHIRO (JP)
SUSAKI JUNICHI (JP)
YAMADA SUZUYA (JP)
Application Number:
PCT/JP2016/074813
Publication Date:
March 09, 2017
Filing Date:
August 25, 2016
Export Citation:
Assignee:
NAT UNIV CORP GUNMA UNIV (JP)
JAPAN ATOMIC ENERGY AGENCY (JP)
DENKA COMPANY LTD (JP)
JAPAN ATOMIC ENERGY AGENCY (JP)
DENKA COMPANY LTD (JP)
International Classes:
G01T1/20; C09K11/00; C09K11/64; G01T1/202
Domestic Patent References:
WO2014030637A1 | 2014-02-27 | |||
WO2015133612A1 | 2015-09-11 |
Foreign References:
JP2007302757A | 2007-11-22 | |||
JP2015111322A | 2015-06-18 |
Other References:
See also references of EP 3343248A4
Attorney, Agent or Firm:
SONODA & KOBAYASHI INTELLECTUAL PROPERTY LAW (JP)
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