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Patent Searching and Data


Title:
CHEMICAL MECHANICAL POLISHING SOLUTION
Document Type and Number:
WIPO Patent Application WO/2019/129107
Kind Code:
A1
Abstract:
Disclosed is a chemical mechanical polishing solution. The polishing solution comprises abrasive particles, a water-soluble polymer, and a nonionic surfactant; the nonionic surfactant is polyvinylpyrrolidone. The polishing solution of the present invention has excellent stability, and can significantly change a polysilicon removal rate under alkaline conditions, thereby achieving adjustment to a selection ratio of polysilicon to silicon oxide and improving the polysilicon planarization efficiency.

Inventors:
PAN YIJUN (CN)
JIN JIANFEN (CN)
ZHANG JIAN (CN)
YAO YING (CN)
SONG KAI (CN)
CAI XINYUAN (CN)
YANG JUNYA (CN)
BIAN PENGCHENG (CN)
LI HENG (CN)
Application Number:
PCT/CN2018/124057
Publication Date:
July 04, 2019
Filing Date:
December 26, 2018
Export Citation:
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Assignee:
ANJI MICROELECTRONICS SHANGHAI CO LTD (CN)
International Classes:
C09G1/02; H01L21/304
Foreign References:
CN1714432A2005-12-28
CN101636465A2010-01-27
CN101457126A2009-06-17
CN102101976A2011-06-22
CN101358109A2009-02-04
CN101451046A2009-06-10
CN103131330A2013-06-05
Attorney, Agent or Firm:
BEIJING DACHENG LAW OFFICES, LLP (CN)
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