Title:
CHIP ABNORMALITY DETECTION CIRCUIT AND CHIP ABNORMALITY DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/073426
Kind Code:
A1
Abstract:
A chip abnormality detection circuit and a chip abnormality detection device; the circuit comprises an abnormal signal detection circuit (40), which is configured to detect the reverse cut-off properties of an electrostatic protection diode (D2) of a chip to be detected and to output a corresponding detection signal.
Inventors:
HUANG XIAOYU (CN)
Application Number:
PCT/CN2018/115877
Publication Date:
April 16, 2020
Filing Date:
November 16, 2018
Export Citation:
Assignee:
HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G01R31/27; G01R31/26
Foreign References:
| CN104008743A | 2014-08-27 | |||
| CN102105016A | 2011-06-22 | |||
| CN101988946A | 2011-03-23 | |||
| CN102213733A | 2011-10-12 | |||
| KR20140002965A | 2014-01-09 |
Attorney, Agent or Firm:
CENFO INTELLECTUAL PROPERTY AGENCY (CN)
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