Title:
CHIP FOR ELECTRICAL MEASUREMENT, AND ELECTRICAL MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/063858
Kind Code:
A1
Abstract:
Provided are a chip for electrical measurement, which is designed for high-sensitivity detection by reading not only changes in steady-state current, but the occurrence of transient current as well; and an electrical measurement device that includes the chip for electrical measurement. This chip for electrical measurement includes a substrate, and a sample migration channel and a sample measurement channel which are formed on the substrate. The sample measurement channel includes a first measurement channel that connects to the sample migration channel, and a second measurement channel that connects to the sample migration channel at the opposite side from the first measurement channel.
Inventors:
BABA YOSHINOBU (JP)
KAJI NORITADA (JP)
YASUI TAKAO (JP)
YASAKI HIROTOSHI (JP)
SANO MAMIKO (JP)
KAWAI TOMOJI (JP)
YANAGIDA TAKESHI (JP)
KAJI NORITADA (JP)
YASUI TAKAO (JP)
YASAKI HIROTOSHI (JP)
SANO MAMIKO (JP)
KAWAI TOMOJI (JP)
YANAGIDA TAKESHI (JP)
Application Number:
PCT/JP2015/079532
Publication Date:
April 28, 2016
Filing Date:
October 20, 2015
Export Citation:
Assignee:
UNIV NAGOYA NAT UNIV CORP (JP)
UNIV OSAKA (JP)
UNIV OSAKA (JP)
International Classes:
G01N27/00; G01N15/14; G01N21/64
Domestic Patent References:
| WO2014027580A1 | 2014-02-20 |
Foreign References:
| JP2009128057A | 2009-06-11 | |||
| US20110089328A1 | 2011-04-21 | |||
| JPH01235833A | 1989-09-20 | |||
| JP2010181399A | 2010-08-19 | |||
| JP2007147602A | 2007-06-14 | |||
| JP2003510034A | 2003-03-18 |
Attorney, Agent or Firm:
MATSUMOTO SEIJI (JP)
Seiji Matsumoto (JP)
Seiji Matsumoto (JP)
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