Title:
CHIP TEST CASE GENERATION METHOD AND APPARATUS, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/125821
Kind Code:
A1
Abstract:
The present application relates to a chip test case generation method and apparatus, and a storage medium. The method may comprise: acquiring a set of input parameters, wherein the set of input parameters comprises M input parameters of a chip, M being an integer not less than 1; and inputting the set of input parameters into a first model, so as to generate a set of first test cases, wherein each first test case comprises values of the M input parameters, the first model is obtained by using a first test case training sample to perform training, and the values of the M input parameters in the first test case training sample satisfy a preset constraint. In the present application, a relatively high function coverage rate can be reached by means of generating a small-scale set of first test cases, such that the time required for testing is effectively shortened, thereby improving the testing efficiency, and saving on the testing costs.
Inventors:
CHEN JUNJIE (CN)
MAO HANGYU (CN)
HAO JIANYE (CN)
SUN YUEFENG (CN)
JIANG JIAJUN (CN)
MAO HANGYU (CN)
HAO JIANYE (CN)
SUN YUEFENG (CN)
JIANG JIAJUN (CN)
Application Number:
PCT/CN2022/143439
Publication Date:
July 06, 2023
Filing Date:
December 29, 2022
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G06F30/3308; G06F115/02
Foreign References:
| CN113297060A | 2021-08-24 | |||
| CN113076250A | 2021-07-06 | |||
| CN113407393A | 2021-09-17 |
Attorney, Agent or Firm:
BEIJING GLOBAL INTELLECTUAL PROPERTY LAW FIRM (CN)
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