Title:
CHIP AND CHIP TEST SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/063413
Kind Code:
A1
Abstract:
A chip (1) and a chip test system,the chip (1) includes a decoding module (11) and a test mode control module (12), and decodes an input signal to determine whether the input signal is a pre-activation signal or not. If the input signal is decoded into a pre-activation signal, then the chip (1) will respond to a subsequent test signal; otherwise, the chip (1) will not respond to any subsequent test signal. By configuring a pre-acti-vation signal, the number of chips (1) to be simultaneously connected to and individ-ually tested by the test equipment (2) can be increased, without the need to occupy more input/output (I/O) interfaces.
Inventors:
NING SHU-LIANG (CN)
Application Number:
PCT/CN2019/106358
Publication Date:
April 02, 2020
Filing Date:
September 18, 2019
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G01R31/28; G11C29/00
Foreign References:
| CN208953667U | 2019-06-07 | |||
| CN109164374A | 2019-01-08 | |||
| US20090040849A1 | 2009-02-12 | |||
| US20090040849A1 | 2009-02-12 | |||
| US20170084580A1 | 2017-03-23 | |||
| US20100074031A1 | 2010-03-25 | |||
| US20060291307A1 | 2006-12-28 | |||
| US8599634B1 | 2013-12-03 | |||
| US5982685A | 1999-11-09 | |||
| US20080080268A1 | 2008-04-03 | |||
| CN1815625A | 2006-08-09 |
Attorney, Agent or Firm:
SHANGHAI SAVVY INTELLECTUAL PROPERTY AGENCY (CN)
Download PDF:
Previous Patent: PDU SESSION RE-ESTABLISHMENT METHOD, APPARATUS AND SYSTEM, AND STORAGE MEDIUM
Next Patent: TEST METHOD AND TEST SYSTEM
Next Patent: TEST METHOD AND TEST SYSTEM