Title:
CHOPPED BIAS MAGNETIC FIELD SOLID-STATE SPIN SENSOR FOR LOW-FREQUENCY MEASUREMENTS OF PHYSICAL QUANTITIES
Document Type and Number:
WIPO Patent Application WO/2019/040434
Kind Code:
A3
Abstract:
Applying a bias magnetic field to a solid-state spin sensor enables vector magnetic field measurements with the solid-state spin sensor. Unfortunately, if the bias magnetic field drifts slowly, it creates noise that confounds low-frequency field measurements. Fortunately, the undesired slow drift of the magnitude of the bias magnetic field can be removed, nullified, or cancelled by reversing the direction (polarity) of the bias magnetic field at known intervals. This makes the resulting solid-state spin sensor system suitable for detecting low-frequency (mHz, for example) changes in magnetic field or other physical parameters.
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Inventors:
PHAM LINH (US)
THOMPSON ERIK (US)
BARRY JOHN (US)
BRAJE DANIELLE (US)
JOHNSON KERRY (US)
THOMPSON ERIK (US)
BARRY JOHN (US)
BRAJE DANIELLE (US)
JOHNSON KERRY (US)
Application Number:
PCT/US2018/047222
Publication Date:
April 09, 2020
Filing Date:
August 21, 2018
Export Citation:
Assignee:
MASSACHUSETTS INST TECHNOLOGY (US)
International Classes:
G01R33/07; G01R33/00; H01L43/06
Foreign References:
| US20170030982A1 | 2017-02-02 | |||
| US20170059666A1 | 2017-03-02 | |||
| US20150369881A1 | 2015-12-24 | |||
| US20120001625A1 | 2012-01-05 | |||
| US20100308813A1 | 2010-12-09 |
Attorney, Agent or Firm:
COLICE, Christopher, Max et al. (US)
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