CIRCUIT BOARD TESTING APPARATUS, METHOD AND SYSTEM

Title:

CIRCUIT BOARD TESTING APPARATUS, METHOD AND SYSTEM

Document Type and Number:

WIPO Patent Application WO/2018/157839

Kind Code:

A1

Abstract:

Disclosed are a circuit board testing apparatus, method and system, belonging to the technical field of testing. The circuit board testing apparatus comprising: a testing bench (10), a display assembly (20), a circuit unit (30), an alignment part (40) and a pressure application part (50). The circuit board testing system (00) comprising the above-mentioned circuit board testing apparatus and a pressure application unit (01), a detection unit (02) and a determination unit (03); the circuit board is used for a display apparatus, and the circuit board comprises a first electrical contact (101).

More Like This:

JP2001243086	TEST PROGRAM DEVELOPING DEVICE
JPH0712901	IC SOCKET WITH BOUNDARY SCAN FUNCTION
JP2001174527	DEVICE AND METHOD FOR DIAGNOSING TROUBLE WITH LOGICAL CIRCUIT, AND RECORDING MEDIUM

Inventors:

ZHANG GUANGHUI (CN)

Application Number:

PCT/CN2018/077779

Publication Date:

September 07, 2018

Filing Date:

March 01, 2018

Export Citation:

Click for automatic bibliography generation Help

Assignee:

HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)

International Classes:

G01R31/28

Foreign References:

CN106872881A	2017-06-20
CN203037760U	2013-07-03
CN103134438A	2013-06-05
CN205720505U	2016-11-23

Attorney, Agent or Firm:

SHENZHEN JINGZHI INTELLECTUAL PROPERTY AGENCY CO. LTD (CN)

Download PDF:

View/Download PDF PDF Help

Previous Patent: COMBINED DC-DC CONVERTER FOR USE IN HYBRID POWER SYSTEM

Next Patent: SPEECH RECOGNITION TESTING METHOD, TESTING TERMINAL, COMPUTER DEVICE, AND STORAGE MEDIUM