Title:
CIRCUIT DELAY SELF-MEASUREMENT METHOD, DEVICE, AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/082391
Kind Code:
A1
Abstract:
Provided are a circuit delay self-measurement method, device (10), and system, said circuit self-measurement device (10) comprising: a first communication interface (103), used for receiving a first analog signal; a receiving circuit module (103), used for performing first processing on said first analog signal to generate a first digital signal; a main control chip (104), used for performing second processing on said first digital signal to generate a second analog signal; a first switch module (102), used, once the main control chip (104) has received the first digital signal, for disconnecting a stationary terminal (1021) from a first connection terminal (1022) and connecting the first stationary terminal (1021) to a second connection terminal (1023); the main control chip (104) is also used, when the first stationary terminal (1021) is connected to the second connection terminal (1023), for sending a second analog signal to the receiving circuit module (103); the receiving circuit module (103) is also used for performing first processing on the second analog signal to generate a second digital signal; the main control chip (104) is also used for determining that the circuit delay of the receiving circuit module (103) is the difference between the time the second digital signal is received and the time the second analog signal is received.
Inventors:
LI DONGSHENG (CN)
Application Number:
PCT/CN2017/100212
Publication Date:
May 11, 2018
Filing Date:
September 01, 2017
Export Citation:
Assignee:
TENDYRON CORP (CN)
International Classes:
H04B17/364
Foreign References:
| CN105307172A | 2016-02-03 | |||
| CN104660330A | 2015-05-27 | |||
| CN1717705A | 2006-01-04 | |||
| CN102647461A | 2012-08-22 | |||
| CN1866801A | 2006-11-22 | |||
| US20030220765A1 | 2003-11-27 |
Other References:
See also references of EP 3537631A4
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