Title:
CIRCUIT SIMULATION DEVICE, CIRCUIT SIMULATION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2014/061312
Kind Code:
A1
Abstract:
Provided is a circuit analysis system using a circuit simulation model generation method such that, in a circuit including an LSI, signal characteristics and power supply characteristics can be analyzed accurately and in a short time. Provided is a circuit simulation device characterized by having: an input device (21) that inputs I-V characteristics, V-T characteristics, operating frequency, and operation pattern of a semiconductor integrated device; a simplified LSI model generation unit (22) that generates a simplified LSI model of the semiconductor integrated device on the basis of the contents of input from the input device (21); and an operating unit (25) that analyzes a circuit including the simplified LSI model.
Inventors:
KAWAKAMI MASASHI (JP)
KUSUMOTO MANABU (JP)
OGAWA MASASHI (JP)
ISHIDA HISASHI (JP)
KUSUMOTO MANABU (JP)
OGAWA MASASHI (JP)
ISHIDA HISASHI (JP)
Application Number:
PCT/JP2013/067352
Publication Date:
April 24, 2014
Filing Date:
June 25, 2013
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06F17/50; H01L21/82
Foreign References:
| JP2010165135A | 2010-07-29 | |||
| JP2010049325A | 2010-03-04 | |||
| JP2002304434A | 2002-10-18 |
Attorney, Agent or Firm:
HAYAMI SHINJI (JP)
Shinji Hayami (JP)
Shinji Hayami (JP)
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