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Patent Searching and Data


Title:
CMP FLUID AND METHOD FOR POLISHING PALLADIUM
Document Type and Number:
WIPO Patent Application WO/2011/007588
Kind Code:
A1
Abstract:
A chemical mechanical polishing (CMP) fluid for polishing palladium, which comprises an organic solvent, 1,2,4-triazole, a phosphoric acid, an oxidizing agent, and abrasive grains; and a method of polishing a substrate by means of a polishing pad while feeding a CMP fluid between the substrate and the polishing pad, wherein the substrate has a palladium layer on the surface facing the polishing pad and the CMP fluid comprises an organic solvent, 1,2,4-triazole, a phosphoric acid, an oxidizing agent, and abrasive grains.

Inventors:
MINAMI Hisataka (13-1, Higashi-cho 4-chome, Hitachi-sh, Ibaraki 55, 〒3178555, JP)
南 久貴 (〒55 茨城県日立市東町四丁目13番1号 日立化成工業株式会社内 Ibaraki, 〒3178555, JP)
SAISYO Ryouta (13-1, Higashi-cho 4-chome, Hitachi-sh, Ibaraki 55, 〒3178555, JP)
税所 亮太 (〒55 茨城県日立市東町四丁目13番1号 日立化成工業株式会社内 Ibaraki, 〒3178555, JP)
AMANOKURA Jin (13-1, Higashi-cho 4-chome, Hitachi-sh, Ibaraki 55, 〒3178555, JP)
Application Number:
JP2010/051671
Publication Date:
January 20, 2011
Filing Date:
February 05, 2010
Export Citation:
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Assignee:
HITACHI CHEMICAL COMPANY, LTD. (1-1 Nishi-Shinjuku 2-chome, Shinjuku-ku Tokyo, 49, 〒1630449, JP)
日立化成工業株式会社 (〒49 東京都新宿区西新宿二丁目1番1号 Tokyo, 〒1630449, JP)
MINAMI Hisataka (13-1, Higashi-cho 4-chome, Hitachi-sh, Ibaraki 55, 〒3178555, JP)
南 久貴 (〒55 茨城県日立市東町四丁目13番1号 日立化成工業株式会社内 Ibaraki, 〒3178555, JP)
SAISYO Ryouta (13-1, Higashi-cho 4-chome, Hitachi-sh, Ibaraki 55, 〒3178555, JP)
税所 亮太 (〒55 茨城県日立市東町四丁目13番1号 日立化成工業株式会社内 Ibaraki, 〒3178555, JP)
International Classes:
H01L21/304; B24B37/00
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA 9th fl.1-1, Marunouchi 2-chom, Chiyoda-ku Tokyo 05, 〒1000005, JP)
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