Title:
COATING THICKNESS MEASUREMENT APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2023/211123
Kind Code:
A1
Abstract:
Disclosed are a coating thickness measurement apparatus and method. The coating thickness measurement apparatus, according to an embodiment of the present invention, comprises: a data obtainment unit configured to, while a substrate coated with a coating material is transported by a coating roll, obtain thickness data indicating the thickness of the coating material coated on a contact portion of the substrate, which is in contact with the coating roll; and a processor configured to generate a virtual memory zone having a plurality of storage areas in which pieces of correction data are distributed and stored, correct the thickness data on the basis of correction data pre-stored in a target storage area selected from among the plurality of storage areas, and generate corrected thickness data.
Inventors:
LEE DO-HYUN (KR)
LEE SEUNG-HEON (KR)
LEE SEUNG-HEON (KR)
Application Number:
PCT/KR2023/005629
Publication Date:
November 02, 2023
Filing Date:
April 25, 2023
Export Citation:
Assignee:
LG CHEMICAL LTD (KR)
International Classes:
G01B11/06; G01B5/00; G01B21/04; G01B21/08; H01M4/04
Foreign References:
KR101810025B1 | 2017-12-18 | |||
JPH0831158B2 | 1996-03-27 | |||
JPH11276959A | 1999-10-12 | |||
KR101185003B1 | 2012-10-02 | |||
KR20130090342A | 2013-08-13 | |||
KR20220053732A | 2022-05-02 | |||
KR20220053733A | 2022-05-02 | |||
KR20230051593A | 2023-04-18 |
Attorney, Agent or Firm:
PHIL & ONZI INT'L PATENT & LAW FIRM (KR)
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