Title:
COMPARISON DEVICE, ANALOG-TO-DIGITAL CONVERSION APPARATUS, SOLID-STATE IMAGING ELEMENT AND IMAGING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/119220
Kind Code:
A1
Abstract:
In order to simplify a comparison device of an analog-to-digital conversion apparatus, in the comparison device, an input signal is input to control terminals of a plurality of signal input transistors. A reference input transistor forms a differential pair with each of the plurality of signal input transistors, and a reference signal is input to a control terminal thereof. A signal input transistor selection unit selects any one of the plurality of signal input transistors and causes the differential pair formed by the selected signal input transistor and the reference input transistor to generate a current corresponding to the difference between the input signal and the reference signal. When a current flowing through any one among the plurality of signal input transistors and the reference input transistor has changed in accordance with the difference, a load unit converts this current change into a voltage change and outputs this voltage change as the result of a comparison between the input signal and the reference signal.
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Inventors:
SAKAKIBARA MASAKI (JP)
Application Number:
PCT/JP2016/085577
Publication Date:
July 13, 2017
Filing Date:
November 30, 2016
Export Citation:
Assignee:
SONY CORP (JP)
International Classes:
H03M1/56; H03K5/08; H04N5/374; H04N5/378
Foreign References:
| JP2001223566A | 2001-08-17 | |||
| JP2013162493A | 2013-08-19 | |||
| JP2006340044A | 2006-12-14 |
Other References:
D. YANG; B. FOWLER; A. EL GAMAL: "A Nyquist Rate Pixel Level ADC for CMOS Image Sensors", PROC. OF IEEE 1998 CUSTOM INTEGRATED CIRCUITS CONF., May 1998 (1998-05-01), pages 237 - 240, XP000900348, DOI: doi:10.1109/CICC.1998.694971
See also references of EP 3402078A4
See also references of EP 3402078A4
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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