Title:
COMPATIBILITY EVALUATION DEVICE, COMPATIBILITY EVALUATION METHOD, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/185444
Kind Code:
A1
Abstract:
The present invention is a compatibility evaluation device, wherein an acquisition means acquires the output of a first predictor and a second predictor in regard to evaluation data. An index determination means determines a generalized backward compatibility index specified by combining a plurality of relationship expressions indicating the relationship between the output of the first predictor and the output of the second predictor. A computation means: uses the output of the first predictor, the output of the second predictor, and the generalized backward compatibility index; and computes a score indicating the compatibility of the first predictor and the second predictor.
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Inventors:
SAKAI TOMOYA (JP)
Application Number:
PCT/JP2021/008149
Publication Date:
September 09, 2022
Filing Date:
March 03, 2021
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06N20/00
Foreign References:
| JP2020004178A | 2020-01-09 | |||
| US8296257B1 | 2012-10-23 |
Other References:
SRIVASTAVA MEGHA MESRIVA@MICROSOFT.COM; NUSHI BESMIRA BENUSHI@MICROSOFT.COM; KAMAR ECE ECKAMAR@MICROSOFT.COM; SHAH SHITAL SHITALS@: "An Empirical Analysis of Backward Compatibility in Machine Learning Systems", PROCEEDINGS OF THE 26TH ACM SIGKDD INTERNATIONAL CONFERENCE ON KNOWLEDGE DISCOVERY & DATA MINING, ACMPUB27, NEW YORK, NY, USA, 23 August 2020 (2020-08-23) - 10 July 2020 (2020-07-10), New York, NY, USA , pages 3272 - 3280, XP058461252, ISBN: 978-1-4503-7998-4, DOI: 10.1145/3394486.3403379
Attorney, Agent or Firm:
NAKAMURA, Toshinobu et al. (JP)
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