COMPONENT INSPECTING DEVICE AND METHOD

WIPO Patent Application WO/2017/188454

A1

This component inspecting device inspects whether two straight wires (9, 10) are in an abnormal state on the basis of a change in the amount of light from a first light beam (3), emitted by a first light emitter (1), and a second light beam (7), emitted by a second light emitter (5), received by a first light receiver (1) and a second light receiver (5) respectively when a component is moved by a moving device in such a way that, in a normal state, the two straight wires (9, 10) shield the first light beam (3) and the second light beam (7) respectively, when the attitude of the two straight wires (9, 10) is such that the arrangement direction thereof intersects the optical axis of the first light beam (3) and the optical axis of a second light beam (7) respectively. By this means it is possible to detect abnormalities such as bending of straight wires, in a component which includes two straight wires that have axial directions parallel to one another and that have different lengths, using a simple configuration and a straightforward operation.

JPS61223635	DEFECT SIZE DISCRIMINATING CIRCUIT
JPS59212741	ETCH PIT DENSITY MEASURING METHOD AND ITS DEVICE
WO/2002/023172	DEVICE FOR THE OPTICAL INSPECTION OF AN OBJECT SURFACE THAT IS TO BE CHECKED FOR DEFECTS

IWASAKI YUKIO (JP)
HIBINO SATORU (JP)
HIRATA KAZUNORI (JP)

PCT/JP2017/017094

November 02, 2017

April 28, 2017

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KAWASAKI HEAVY IND LTD (JP)

G01N21/95; G01B11/24; H05K13/08

WO2015071929A1

2015-05-21

JPS56143902A	1981-11-10
JPH02290504A	1990-11-30
US4598456A	1986-07-08
JPS56124001A	1981-09-29
JP2008209308A	2008-09-11
JPH0471104U	1992-06-24
JPH04196455A	1992-07-16
US20100306998A1	2010-12-09

See also references of EP 3450966A4

NAZUKA Satoshi et al. (JP)

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