Title:
COMPONENT AND SEMICONDUCTOR MANUFACTURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/026818
Kind Code:
A1
Abstract:
The component according to the present invention is provided with a film having polycrystalline yttrium oxide. In an X-ray diffraction pattern of the film, the ratio Im/Ic of the maximum intensity Im of peaks pertaining to monoclinic yttrium oxide to the maximum intensity Ic of peaks pertaining to cubic yttrium oxide satisfies the expression: 0 ≤ Im/Ic ≤ 0.002.
Inventors:
HINO TAKASHI (JP)
INOUE TETSUO (JP)
SAITO SHUICHI (JP)
INOUE TETSUO (JP)
SAITO SHUICHI (JP)
Application Number:
PCT/JP2018/028376
Publication Date:
February 07, 2019
Filing Date:
July 30, 2018
Export Citation:
Assignee:
TOSHIBA KK (JP)
TOSHIBA MATERIALS CO LTD (JP)
TOSHIBA MATERIALS CO LTD (JP)
International Classes:
C23C14/08; C23C8/12; C23C14/34; H01L21/3065
Foreign References:
JP2009287058A | 2009-12-10 | |||
JP2000256844A | 2000-09-19 | |||
CN101117702A | 2008-02-06 | |||
JPH09102272A | 1997-04-15 | |||
JP2012191200A | 2012-10-04 |
Attorney, Agent or Firm:
SAKURA PATENT OFFICE, P.C. (JP)
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