Title:
COMPOSITION FOR FORMING UNDERLYING FILM CONTAINING DEXTRIN ESTER COMPOUND
Document Type and Number:
WIPO Patent Application WO/2005/043248
Kind Code:
A1
Abstract:
[PROBLEMS] Disclosed is a composition for forming an underlying film for lithography which is used in a lithography process in semiconductor device production. Also disclosed is an underlying film for lithography which has a higher dry etching rate than a photoresist and does not cause intermixing with the photoresist. [MEANS FOR SOLVING PROBLEMS] The composition for forming an underlying film for lithography contains a dextrin ester compound wherein at least 50% of hydroxyl groups are transformed to ester groups, a crosslinkable compound and an organic solvent.
Inventors:
TAKEI SATOSHI (JP)
SAKAIDA YASUSHI (JP)
SHINJO TETSUYA (JP)
SAKAIDA YASUSHI (JP)
SHINJO TETSUYA (JP)
Application Number:
PCT/JP2004/016129
Publication Date:
May 12, 2005
Filing Date:
October 29, 2004
Export Citation:
Assignee:
NISSAN CHEMICAL IND LTD (JP)
TAKEI SATOSHI (JP)
SAKAIDA YASUSHI (JP)
SHINJO TETSUYA (JP)
TAKEI SATOSHI (JP)
SAKAIDA YASUSHI (JP)
SHINJO TETSUYA (JP)
International Classes:
G03F7/09; G03F7/11; H01L21/027; (IPC1-7): G03F7/11; H01L21/027
Domestic Patent References:
WO2002005035A1 | 2002-01-17 | |||
WO2004061526A1 | 2004-07-22 |
Foreign References:
JP2002047430A | 2002-02-12 | |||
JP2000294504A | 2000-10-20 | |||
JPS6262521A | 1987-03-19 | |||
JP2002107938A | 2002-04-10 |
Other References:
See also references of EP 1681594A4
Attorney, Agent or Firm:
Hanabusa, Tsuneo c/o Hanabusa, Patent Office (Shin-Ochanomizu Urban Trinity 2,
Kandasurugadai 3-chom, Chiyoda-ku Tokyo 62, JP)
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