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Patent Searching and Data


Title:
COMPOUND, RESIN, COMPOSITION, AND PATTERN FORMING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/142897
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing a compound, etc., useful in forming: a photoresist to which a wet process is applicable, and which has excellent heat resistance, excellent solubility, and excellent etching resistance; and an underlayer film for the photoresist. The problem can be solved by a compound represented by formula (1).

Inventors:
ECHIGO MASATOSHI (JP)
OKADA YU (JP)
TAKIGAWA TOMOAKI (JP)
MAKINOSHIMA TAKASHI (JP)
Application Number:
PCT/JP2019/001421
Publication Date:
July 25, 2019
Filing Date:
January 18, 2019
Export Citation:
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Assignee:
MITSUBISHI GAS CHEMICAL CO (JP)
International Classes:
C07C321/26; C08G10/04; C09K3/00; G03F7/11; G03F7/20; G03F7/26
Domestic Patent References:
WO2017018360A12017-02-02
WO2001068595A12001-09-20
WO2013024778A12013-02-21
WO2013024779A12013-02-21
WO2004066377A12004-08-05
WO2015080240A12015-06-04
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ALOISIO DE ANDRADE BARTOLOMEU ET AL.: "Efficient one-pot synthesis of 14-aryl-14H-dibenzo [a,j]xanthene derivatives promoted by niobium pentachloride", CHEMICAL PAPERS, vol. 68, no. 11, 2014, pages 1593 - 1600, XP035385161
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See also references of EP 3744710A4
Attorney, Agent or Firm:
INABA, Yoshiyuki et al. (JP)
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