CONDENSATION TESTING DEVICE AND CONDENSATION TESTING METHOD

Title:

CONDENSATION TESTING DEVICE AND CONDENSATION TESTING METHOD

Document Type and Number:

WIPO Patent Application WO/2010/125748

Kind Code:

A1

Abstract:

A condensation testing device (10) is provided with: an adjustment tank (12) capable of adjusting the temperature and humidity of air to predetermined temperature and humidity; a testing tank (14) installed separately from the adjustment tank (12) and having a sample base (43) which has a mounting surface (43a) on which a sample body (W) can be placed and which can be cooled; and ducts (17, 18) for connecting the adjustment tank (12) and the testing tank (14). The testing tank (14) is provided with an air guide member (57) which, when air which flows into the testing tank (14) through the duct (17) flows on to the sample base (43) from a side thereof, guides the air in the direction tilted downward at a predetermined angle, the guidance being performed at a position right above the sample base (43) at the end thereof which is on the upstream side of the air flow.

Inventors:

SHIMADA TETSUYA (JP)
TANAKA HIROKAZU (JP)
OKAMOTO AKIRA (JP)
MIZUMA YOSHINORI (JP)
OKADA SEIICHI (JP)

Application Number:

PCT/JP2010/002495

Publication Date:

November 04, 2010

Filing Date:

April 05, 2010

Export Citation:

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Assignee:

ESPEC CORP (JP)
MURATA MANUFACTURING CO (JP)
SHIMADA TETSUYA (JP)
TANAKA HIROKAZU (JP)
OKAMOTO AKIRA (JP)
MIZUMA YOSHINORI (JP)
OKADA SEIICHI (JP)

International Classes:

G01N17/00

Foreign References:

JPH1078387A	1998-03-24
JP2007271551A	2007-10-18
US5692556A	1997-12-02
JPH0727374A	1995-01-27
JPH0429311Y2	1992-07-16
JP2003130399A	2003-05-08
JP2007271551A	2007-10-18
JP3113823B2	2000-12-04
JPH05164684A	1993-06-29

Other References: