Title:
CONNECTION TERMINAL AND CONDUCTIVITY INSPECTING EQUIPMENT USING SAME
Document Type and Number:
WIPO Patent Application WO/2014/073368
Kind Code:
A1
Abstract:
Provided is a connection terminal that has high contact reliability and, by being very elastic, does not damage a part that is being contacted. A connection terminal (11) comprising a support (20) that is for supporting an elastically deformable shaft (6) and rotates about the shaft (6), and a contact part (12) that extends from the support (20) and has an abutting portion (13) that can abut a test body (7) on the free end, wherein the contact part (12) elastically deforms when the abutting portion (13) abuts the test body (7) and rotates with the support (20).
Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2013/078589
Publication Date:
May 15, 2014
Filing Date:
October 22, 2013
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R1/073; H01R33/76
Foreign References:
| JP2008157800A | 2008-07-10 | |||
| JP2002246128A | 2002-08-30 | |||
| JP2001102141A | 2001-04-13 | |||
| JP2001083179A | 2001-03-30 | |||
| JP2009103563A | 2009-05-14 | |||
| JP2010118220A | 2010-05-27 |
Other References:
See also references of EP 2919020A4
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
Mutsumi Sameshima (JP)
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